Home A Gated Four Probe Technique for Field Effect Measurements on Disordered Organic Semiconductors
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A Gated Four Probe Technique for Field Effect Measurements on Disordered Organic Semiconductors

  • Elizabeth von Hauff EMAIL logo , Nicolas Spethmann and Jürgen Parisi
Published/Copyright: June 2, 2014

Received: 2008-5-15
Published Online: 2014-6-2
Published in Print: 2008-9-1

© 1946 – 2014: Verlag der Zeitschrift für Naturforschung

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