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Aperture Card Scanning in an Engineering Environment
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Tony Wicks
Published/Copyright:
October 19, 2009
Published Online: 2009-10-19
Published in Print: 1992
Walter de Gruyter
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Articles in the same Issue
- Titelei
- Sonstiges
- Comment and News
- Interfacing Microform Scanners for Document Image Processing Applications
- A Review of the Microfilm Scanners on the Market
- Aperture Card Scanning in an Engineering Environment
- Library Applications for Microfilm Digitisation
- State University of New York at Binghamton Libraries Microform Task Force
- National Historical Publications and Records Commission Microform Guidelines
- National Historical Publications and Records Commission Microform Guidelines Publisher/Vendor Supplement
- Microform Reviews
- Book Reviews
- Index
Articles in the same Issue
- Titelei
- Sonstiges
- Comment and News
- Interfacing Microform Scanners for Document Image Processing Applications
- A Review of the Microfilm Scanners on the Market
- Aperture Card Scanning in an Engineering Environment
- Library Applications for Microfilm Digitisation
- State University of New York at Binghamton Libraries Microform Task Force
- National Historical Publications and Records Commission Microform Guidelines
- National Historical Publications and Records Commission Microform Guidelines Publisher/Vendor Supplement
- Microform Reviews
- Book Reviews
- Index
