Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
Abstract
The structure of the fiber –matrix interface region of carbon-fiber/carbon-matrix (C/C)-composites, which is important for the mechanical properties of a composite, was studied by transmission electron microscopy. The pyrolytic carbon matrix was obtained by chemical vapor infiltration of carbon fiber preforms with different fiber architecture and fiber types. While the texture of the carbon matrix can be controlled by the infiltration conditions, the carbon texture at the fiber –matrix interface differs from the bulk matrix and cannot be determined by the infiltration parameters. We often observe a high-textured layer with a thickness up to 100 nm at the interface prior to the formation of the bulk matrix with a lower texture. The fiber –matrix interface properties of C/C-composites are compared with the interface of pyrolytic carbon layers deposited on planar Si-, BN- and cordierite-substrates. In contrast to BN-substrates, thin high-textured pyrolytic layers are observed at the interface of carbon on planar Si- and cordierite-substrates where strong bonding between pyrolytic carbon and the substrate is achieved by the formation of Si-C bonds. Stress-induced ordering is discussed as a mechanism for the formation of the high-textured interface layers.
Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
Funding statement: This research was performed in the Collaborative Research Center 551 (University of Karlsruhe) which is funded by the German Research Foundation (Deutsche Forschungsgemeinschaft)
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© 2006 Carl Hanser Verlag, München
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Articles in the same Issue
- Frontmatter
- Editorial
- Professor Dr. Knut Urban 65 Years
- Basic
- Ordering processes and atomic defects in FeCo
- Atomic resolution electron tomography: a dream?
- Electron tomography of microelectronic device interconnects
- Aberration correction in electron microscopy
- Off-axis electron holography: Materials analysis at atomic resolution
- Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
- Prospects of the multislice method for CBED pattern calculation
- Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
- Quantitative assessment of nanoparticle size distributions from HRTEM images
- Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
- Structural domains in antiferromagnetic LaFeO3 thin films
- Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
- Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
- Dislocation imaging in fcc colloidal single crystals
- Applied
- Omega phase transformation – morphologies and mechanisms
- Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
- Wetting of aluminium-based complex metallic alloys
- Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
- Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
- On the formation of Si nanowires by molecular beam epitaxy
- Self-induced oscillations in Si and other semiconductors
- Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
- An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
- Radiation damage during HRTEM studies in pure Al and Al alloys
- Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
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- Microstructure and properties of surface-treated Timetal 834
- Notifications
- Personal
- Conferences