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Prospects of the multislice method for CBED pattern calculation

  • Ute Kaiser EMAIL logo und Andrey Chuvilin
Veröffentlicht/Copyright: 12. Februar 2022
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Abstract

We recently showed that the Multisclice method can be used to elucidate the crystal volume contribution to a CBED pattern. Here, we demonstrate in more detail how the directions of each HOLZ line, their Laue zone order, and the specimen thickness determine the volume segment of the Bragg scattering cone of the electron beam and show that secondary rescattering from this volume must take place for deficient line formation in the (000) CBED disk. Moreover, additional prospects of the multislice method are demonstrated such as calculation of line splitting in bent crystals, hollow cone dark-field CBED, large-angle CBED, and whole diffraction patterns including Kikuchi lines.


Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday



Prof. Dr. Ute Kaiser Universität Ulm, Zentrale Einrichtung Elektronenmikroskopie Albert-Einstein-Allee 11, D-89069 Ulm, Germany Tel.: +49 731 50 22950 Fax: +49 731 50 22958

Funding statement: The authors are grateful to Dr. Johannes Biskupek from Ulm University for molecular dynamic calculations and to Prof. Kenji Tsuda from Tohoku University Sendai for the energy filtered Si [111] CBED pattern. We acknowledge the DFG KA 1295/2-3 for financial support

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Received: 2006-02-01
Accepted: 2006-04-24
Published Online: 2022-02-12

© 2006 Carl Hanser Verlag, München

Artikel in diesem Heft

  1. Frontmatter
  2. Editorial
  3. Professor Dr. Knut Urban 65 Years
  4. Basic
  5. Ordering processes and atomic defects in FeCo
  6. Atomic resolution electron tomography: a dream?
  7. Electron tomography of microelectronic device interconnects
  8. Aberration correction in electron microscopy
  9. Off-axis electron holography: Materials analysis at atomic resolution
  10. Determination of phases of complex scattering amplitudes and two-particle structure factors by investigating diffractograms of thin amorphous foils
  11. Prospects of the multislice method for CBED pattern calculation
  12. Electron energy-loss spectrometry for metals:some thoughts beyond microanalysis
  13. Quantitative assessment of nanoparticle size distributions from HRTEM images
  14. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide
  15. Structural domains in antiferromagnetic LaFeO3 thin films
  16. Short-range order of liquid Ti72.3Fe27.7 investigated by a combination of neutron scattering and X-ray diffraction
  17. Extended interfacial structure between two asymmetrical facets of a Σ = 9 grain boundary in copper
  18. Dislocation imaging in fcc colloidal single crystals
  19. Applied
  20. Omega phase transformation – morphologies and mechanisms
  21. Mixed (Sr1 − xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques
  22. Wetting of aluminium-based complex metallic alloys
  23. Annealing-induced phase transitions in a Zr–Ti–Nb–Cu–Ni–Al bulk metallic glass matrix composite containing quasicrystalline precipitates
  24. Special planar defects in the structural complex metallic alloys of Al–Pd–Mn and Al–Ni–Rh
  25. On the formation of Si nanowires by molecular beam epitaxy
  26. Self-induced oscillations in Si and other semiconductors
  27. Growth, interface structure, and magnetic properties of Fe/GaAs and Fe3Si/GaAs hybrid systems
  28. An investigation of improved titanium/titanium nitride barriers for submicron aluminum-filled contacts by energy-filtered transmission electron microscopy
  29. Radiation damage during HRTEM studies in pure Al and Al alloys
  30. Cross-sectional high-resolution transmission electron microscopy at Mo/Si multilayer stacks
  31. Structural properties of the fiber –matrix interface in carbon-fiber/carbon-matrix composites and interfaces between carbon layers and planar substrates
  32. Microstructure and properties of surface-treated Timetal 834
  33. Notifications
  34. Personal
  35. Conferences
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