Nondestructive Extraction of Parameters of Multilayered Media Using Terahertz Pulse Technique

References

[1] J. A. Hejase, P. R. Paladhi, and P. P. Chahal, “Terahertz characterization of dielectric substrates for component design and nondestructive evaluation of packages,”,” IEEE Trans. THz Sci. Technol., vol. 1, pp. 1685–1694, 2011.10.1109/TCPMT.2011.2163632Search in Google Scholar

[2] A. Dobroiu, C. Otani, and K. Kawase, “Terahertz-wave sources and imaging applications,” Meas. Sci. Technol., vol. 17,, pp. R161–R174, 2006.10.1088/0957-0233/17/11/R01Search in Google Scholar

[3] X. Shen, C. Dietlein, E. Grossman, Z. Popovic, and F. Meyer, “Detection and segmentation of concealed objects in terahertz images,” IEEE Trans. Image Process., vol. 17, pp. 2464–2475, 2008.Search in Google Scholar

[4] J. F. Federici, et al., “THz imaging and sensing for security applications—Explosives, weapons and drugs,” Semicond. Sci. Technol., vol. 20, pp. S266–S280, 2005.10.1088/0268-1242/20/7/018Search in Google Scholar

[5] J. Bianca Jackson, et al., “A survey of terahertz applications in cultural heritage conservation science,” IEEE Trans. THz Sci. Technol., vol. 1, no. 1, pp. 220–231, 2011.10.1109/TTHZ.2011.2159538Search in Google Scholar

[6] E. Pickwell, et al., “In vivo study of human skin using pulsed terahertz radiation,” Phys. Med. Biol., vol. 49, pp. 1595–1607, 2004.10.1088/0031-9155/49/9/001Search in Google Scholar PubMed

[7] F. Stewing, C. Brendel, and M. Schilling, “Three dimensional near-field radiation imaging up to the THz-regime,” Frequenz, vol. 62, pp. 149–152, 2008.10.1515/FREQ.2008.62.5-6.149Search in Google Scholar

[8] H. L. Hartnagel, D. Schönherr, N. H. Osman, and C. Free, “Optically hidden, secured data of matrix of metal squares by thz wave interaction,” Frequenz, vol. 64, pp. 85–87, 2011.10.1515/FREQ.2010.64.5-6.85Search in Google Scholar

[9] L. Duvillaret, F. Garet, and J. Coutaz, “Highly precise determination of both optical constants and sample thickness in teraherz timedomain spectroscopy,” Appl. Opt., vol. 38, pp. 409–415, 1999.10.1364/AO.38.000409Search in Google Scholar PubMed

[10] T. D. Dorney, R. G. Baraniuk, and D. M. Mittleman, “Material parameter estimation with terahertz time-domain spectroscopy,” J. Opt. Soc. Am. A, vol. 18, pp. 1562–1571, 2001.10.1364/JOSAA.18.001562Search in Google Scholar PubMed

[11] J. A. Hejase, E. J. Rothwell, and P. Chahal, “Self-calibrating technique for terahertz time-domain material parameter extraction,” J. Opt. Soc. Am. A, vol. 28, pp. 2561–2567, 2011.10.1364/JOSAA.28.002561Search in Google Scholar PubMed

[12] K. H. Jin, et al., “High-speed terahertz reflection threedimensional imaging for nondestructive evaluation,” Opt. Express, vol. 20, pp. 25432–254405, 2012.10.1364/OE.20.025432Search in Google Scholar PubMed

[13] K. Su, Y.-C. Shen, and J. Axel Zeitler, “Terahertz sensor for non-contact thickness and quality measurement of automobile paints of varying complexity,” IEEE Trans. THz Sci. Technol., vol. 4, pp. 432–439, Jul. 2014.10.1109/TTHZ.2014.2325393Search in Google Scholar

[14] Y.-C. Shen and P. F. Taday, “Development and application of terahertz pulsed imaging for nondestructive inspection of pharmaceutical tablet,” IEEE J. Sel. Topics Quantum Electron., vol. 14, pp. 407–415, Apr. 2008.10.1109/JSTQE.2007.911309Search in Google Scholar

[15] J. Zhang, et al., “Noncontact detection of Teflon inclusions in glass-fiber-reinforced polymer composites using terahertz imaging,” Appl. Opt., vol. 55, pp. 10215–10222, 2016.10.1364/AO.55.010215Search in Google Scholar PubMed

[16] N. Palka, S. Krimi, et. al., “Precise determination of thicknesses of multilayered polyethylene composite materials by terahertz time-domain spectroscopy,” J Infrared Milli. Terahz. Waves, vol. 36,, pp. 578–596, 2015.10.1007/s10762-015-0156-6Search in Google Scholar

[17] S. Krimi, J. Klier, M. Herrmann, J. Jonuscheit, and R. Beigang, “Inline multilayered thickness sensing by using terahertz time-domain spectroscopy in reflection geometry,” 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Mainz, Germany, 2013.10.1109/IRMMW-THz.2013.6665871Search in Google Scholar

[18] R. Wilk, I. Pupeza, R. Cernat, and M. Koch, “Highly accurate thz time-domain spectroscopy of multilayered structures,” IEEE J. Sel. Topics Quantum Electron., vol. 14, pp. 392–398, Apr. 2008.10.1109/JSTQE.2007.910981Search in Google Scholar

[19] A. Brahma, A. Weigela, S. Riehemannb, G. Notnib, and A. Tunnermanna, “Highly precise parameter extraction of thin multi-layers in THz transmission and reflection geometry,” 36th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Houston, Texas, 2011.10.1109/irmmw-THz.2011.6104869Search in Google Scholar

[20] S. P. Singh, A. K. Jha, and M. J. Akhtar, “A contactless thickness measurement of multilayered structure using terahertz time domain spectroscopy,” IEEE International Conference on Antenna Measurement and Applications, Chiang Mai, Thailand, 2015.10.1109/CAMA.2015.7428187Search in Google Scholar

[21] J. L. M. van Mechelen, A. B. Kuzmenko, and H. Merbold, “Stratified dispersive model for material characterization using terahertz time-domain spectroscopy,” Opt. Lett., vol. 39, pp. 3853–3856, 2014.Search in Google Scholar

[22] J. Choi, W. S. Kwon, K.-S. Kim, and S. Kim, “Nondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy,” NDT&E International, vol. 80, pp. 71–76, 2016.10.1016/j.ndteint.2016.02.011Search in Google Scholar

[23] F. Sanjuan, A. Bockelt, and B. Vidal, “Determination of refractive index and thickness of a multilayered structure with a single terahertz time domain spectroscopy measurement,” Appl. Opt., vol. 53, pp. 4910–4913, Aug. 2014.10.1364/AO.53.004910Search in Google Scholar PubMed

[24] J. A. Hejase, E. J. Rothwell, and P. Chahal, “A multiple angle method for thz time domain material characterization,” IEEE Trans. THz Sci. Technol., vol. 3, pp. 656–665, 2013.10.1109/TTHZ.2013.2278460Search in Google Scholar

[25] (2016). CST-Computer Simulation Technology [Online]. Available: http://www.cst.com.Search in Google Scholar

[26] M. N. Afsar, A. Moonshiram, and Y. Wang “Comparison of millimeter wave dielectric measurement using various techniques,” IEEE Antennas and Propagation Society International Symposium., Columbus, USA, pp. 627–630, 2003.Search in Google Scholar

[27] B.Panzner, M.Anis, A. J.Ostingmeier, and A.Omar, “A numerically robust method for determination of dielectric material parameters.” 39th European Microwave Conference, Rome, Italy, pp. 1599–1602, Sep 29 – Oct 1, 2009.Search in Google Scholar