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Multiple Dependent State Sampling Inspection Plan for Lindley Distributed Quality Characteristic

  • Shovan Biswas and Sudhansu S. Maiti EMAIL logo
Published/Copyright: January 4, 2022
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Abstract

This article develops multiple dependent state (MDS) sampling inspection plans based on the mean of lifetime quality characteristic that follows non-normal distributions viz., exponential and Lindley distribution. In this plan, the lot quality is measured by the lot mean (𝜇). We have estimated the optimal plan parameters of the proposed technique by non-linear optimization approaches considering acceptable quality level and rejection quality level. We have compared the sample size between the MDS sampling inspection plan and the single sampling inspection plan for the variable. Finally, we have taken two examples to illustrate the proposed technique.

MSC 2010: 62P30

Acknowledgements

We are grateful to the Editor-in-Chief and anonymous referee for making some constructive suggestions and comments on an earlier version of the manuscript which resulted in this much improved version.

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Received: 2021-08-29
Revised: 2021-11-23
Accepted: 2021-11-23
Published Online: 2022-01-04
Published in Print: 2022-06-01

© 2022 Walter de Gruyter GmbH, Berlin/Boston

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