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Design of easily testable combinational circuits

  • V. N. NOSKOV
Published/Copyright: October 9, 2009
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Discrete Mathematics and Applications
From the journal Volume 3 Issue 5

Published Online: 2009-10-09
Published in Print: 1993

Walter de Gruyter

Articles in the same Issue

  1. The waiting time and related statistics in the multinomial scheme: a survey
  2. A problem of testing hypotheses on parameters of a generalized moving-average process
  3. A threshold function in the Shannon effect for Boolean functions
  4. The cutwidth of a graph and the vertex separation number of the line graph
  5. An approach to solving a Boolean linear equation with integer positive coefficients
  6. An expansion of Boolean function into a sum of products of subfunctions
  7. Design of easily testable combinational circuits
https://doi.org/10.1515/dma.1993.3.5.535

Articles in the same Issue

  1. The waiting time and related statistics in the multinomial scheme: a survey
  2. A problem of testing hypotheses on parameters of a generalized moving-average process
  3. A threshold function in the Shannon effect for Boolean functions
  4. The cutwidth of a graph and the vertex separation number of the line graph
  5. An approach to solving a Boolean linear equation with integer positive coefficients
  6. An expansion of Boolean function into a sum of products of subfunctions
  7. Design of easily testable combinational circuits
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