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Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

  • Iľya G. Liubich EMAIL logo and Dmitriy S. Romanov EMAIL logo
Published/Copyright: February 17, 2022

Abstract

We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.


Note: Originally published in Diskretnaya Matematika (2021) 33,№1, 20–30 (in Russian).


  1. Funding: Research was carried out in the framework of the State Budgetary Research Project 5.4.19 of the Faculty of Computational Mathematics and Cybernetics, Lomonosov Moscow State University

References

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Received: 2021-01-21
Published Online: 2022-02-17
Published in Print: 2022-02-23

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