Abstract
We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.
Note: Originally published in Diskretnaya Matematika (2021) 33,№1, 20–30 (in Russian).
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Funding: Research was carried out in the framework of the State Budgetary Research Project 5.4.19 of the Faculty of Computational Mathematics and Cybernetics, Lomonosov Moscow State University
References
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© 2022 Walter de Gruyter GmbH, Berlin/Boston
Articles in the same Issue
- Frontmatter
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- Generalized de Bruijn graphs
- A family of asymptotically independent statistics in polynomial scheme containing the Pearson statistic
- Linear recurrent relations, power series distributions, and generalized allocation scheme
- Variance of the number of cycles of random A-permutation
- Multi-dimensional Kronecker sequences with a small number of gap lengths
Articles in the same Issue
- Frontmatter
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- Generalized de Bruijn graphs
- A family of asymptotically independent statistics in polynomial scheme containing the Pearson statistic
- Linear recurrent relations, power series distributions, and generalized allocation scheme
- Variance of the number of cycles of random A-permutation
- Multi-dimensional Kronecker sequences with a small number of gap lengths