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Single tests for logical gates
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Kirill A. Popkov
Published/Copyright:
December 8, 2015
Abstract
The paper is concerned with checking problems for failure and state diagnostics of N gates implementing in a working condition a given Boolean function f(x1, . . . , xn). This problem is solved by composing single-output circuits from these gates and analyzing the output values of these circuits on all input tuples of variables. An arbitrary constant malfunction at the output of any single gate is allowed. It is required to minimize the number of circuits required for a check for failure and determination of all states of all gates. Exact values for the minimal possible number of such circuits are obtained.
Received: 2014-11-26
Published Online: 2015-12-8
Published in Print: 2015-12-1
© 2015 by Walter de Gruyter Berlin/Boston
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- Frontmatter
- Cardinality estimates for some classes of regular languages
- On large deviations of a branching process in random environments with immigration at moments of extinction
- Existence of arbitrarily long square-free words with one possible mismatch
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- Single tests for logical gates
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Articles in the same Issue
- Frontmatter
- Cardinality estimates for some classes of regular languages
- On large deviations of a branching process in random environments with immigration at moments of extinction
- Existence of arbitrarily long square-free words with one possible mismatch
- On frequencies of elements in multicyclic random sequence modulo 4
- Single tests for logical gates
- On the probability of coincidence of cycle lengths for independent random permutations with given number of cycles
