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Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
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Dmitry S. Romanov
Published/Copyright:
October 7, 2014
Abstract
It is constructively proved that any nonconstant Boolean function may be realized (over an arbitrary complete basis of gates) by a testable combinational circuit admitting (under single inverse or arbitrary constant faults at outputs of gates) a single fault detection test set whose cardinality does not exceed 4.
Keywords: circuit of functional elements; single fault detection test; constant fault at the output of gate; Shannon function; length of a test; easily testable circuit.
Published Online: 2014-10-7
Published in Print: 2014-10-1
© 2014 by Walter de Gruyter Berlin/Boston
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Articles in the same Issue
- Frontmatter
- Order of power of planar circuits implementing Boolean functions
- Automata generated p-languages
- Fault detection and diagnostic tests for logic gates
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
- Characteristic submodules of injective modules over strongly prime rings
Articles in the same Issue
- Frontmatter
- Order of power of planar circuits implementing Boolean functions
- Automata generated p-languages
- Fault detection and diagnostic tests for logic gates
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
- Characteristic submodules of injective modules over strongly prime rings
