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Measurement of susceptibility artifacts with histogram-based reference value on magnetic resonance images according to standard ASTM F2119

  • Andreas Heinrich EMAIL logo , Ulf K. Teichgräber and Felix V. Güttler
Published/Copyright: May 20, 2015

Abstract

Objective: The standard ASTM F2119 describes a test method for measuring the size of a susceptibility artifact based on the example of a passive implant. A pixel in an image is considered to be a part of an image artifact if the intensity is changed by at least 30% in the presence of a test object, compared to a reference image in which the test object is absent (reference value). The aim of this paper is to simplify and accelerate the test method using a histogram-based reference value.

Materials and methods: Four test objects were scanned parallel and perpendicular to the main magnetic field, and the largest susceptibility artifacts were measured using two methods of reference value determination (reference image-based and histogram-based reference value). The results between both methods were compared using the Mann-Whitney U-test.

Results: The difference between both reference values was 42.35±23.66. The difference of artifact size was 0.64±0.69 mm. The artifact sizes of both methods did not show significant differences; the p-value of the Mann-Whitney U-test was between 0.710 and 0.521.

Conclusions: A standard-conform method for a rapid, objective, and reproducible evaluation of susceptibility artifacts could be implemented. The result of the histogram-based method does not significantly differ from the ASTM-conform method.


Corresponding author: Andreas Heinrich, Department of Radiology, University Hospital Jena, Erlanger Allee 101, 07747 Jena, Germany, Phone: +49 (0) 3641 9-324 898, Fax: +49 (0) 3641 9-324 832, E-mail:

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Received: 2014-12-12
Accepted: 2015-4-17
Published Online: 2015-5-20
Published in Print: 2015-12-1

©2015 by De Gruyter

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