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Telecentric line scanning system based on a ring surface mirror for inline processes

  • Florian Loosen

    Florian Loosen received his master’s degree in ‘Applied Physics’ and his bachelor’s degree in ‘Optics and Laser Technology’ at the RheinAhrCampus Remagen (Hochschule Koblenz – University of Applied Sciences). He continued his research as a PhD student in the research department of Prof. G. Leuchs at the Institute of Optics, Information and Photonics (research group of Prof. N. Lindlein) at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU) until now. The topics of his theses (bachelor and master) were laser beam welding with a special design of a laser head and diffractive optical elements (DOEs) for polymer welding processes.

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    , Norbert Lindlein

    Norbert Lindlein received his diploma in ‘Physics’ and his PhD at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU). In 2002, he received his habilitation. After that, he was appointed as ‘Privatdozent’ and a few years later as ‘Außerplanmäßiger Professor’. Currently, he is the group leader at the research group ODEM (Optical Design, Measurement and Microoptics) at the Institute of Optics, Information and Photonics of Prof. G. Leuchs. His research interests include the simulation and design of optical systems, diffractive optics, microoptics, and optical measurement techniques using interferometry or Shack-Hartmann wavefront sensors.

    and Klaus Donner

    Klaus Donner received his diploma in ‘Mathematics’ and his PhD at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU) with emphasis on functional analysis and numerical mathematics. In 1981, he received his habilitation. After an associate professorship at the Universität der Bundeswehr München, he built up the educational branch of numerical and classical analysis from the corresponding chair at the University of Passau. Since his emeritation in 2010, he is the leading director of the R&D section of the alfavision GmbH & Co. KG, a spin-off enterprise in optical metrology and control systems.

Published/Copyright: May 9, 2016
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Abstract

In many industrial applications, an inline measurement of a production process poses a difficult challenge for any optical system. Therefore, telecentric optical systems are being used to ensure an independence of the magnification of the object from the working distance. Usually, telecentric optical systems are impractical for inline applications with large objects due to the size of the telecentric optical system, which has to be larger than the object. Therefore, a new approach of telecentric line scanning systems was developed to gain access to this advantage.

About the authors

Florian Loosen

Florian Loosen received his master’s degree in ‘Applied Physics’ and his bachelor’s degree in ‘Optics and Laser Technology’ at the RheinAhrCampus Remagen (Hochschule Koblenz – University of Applied Sciences). He continued his research as a PhD student in the research department of Prof. G. Leuchs at the Institute of Optics, Information and Photonics (research group of Prof. N. Lindlein) at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU) until now. The topics of his theses (bachelor and master) were laser beam welding with a special design of a laser head and diffractive optical elements (DOEs) for polymer welding processes.

Norbert Lindlein

Norbert Lindlein received his diploma in ‘Physics’ and his PhD at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU). In 2002, he received his habilitation. After that, he was appointed as ‘Privatdozent’ and a few years later as ‘Außerplanmäßiger Professor’. Currently, he is the group leader at the research group ODEM (Optical Design, Measurement and Microoptics) at the Institute of Optics, Information and Photonics of Prof. G. Leuchs. His research interests include the simulation and design of optical systems, diffractive optics, microoptics, and optical measurement techniques using interferometry or Shack-Hartmann wavefront sensors.

Klaus Donner

Klaus Donner received his diploma in ‘Mathematics’ and his PhD at the Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU) with emphasis on functional analysis and numerical mathematics. In 1981, he received his habilitation. After an associate professorship at the Universität der Bundeswehr München, he built up the educational branch of numerical and classical analysis from the corresponding chair at the University of Passau. Since his emeritation in 2010, he is the leading director of the R&D section of the alfavision GmbH & Co. KG, a spin-off enterprise in optical metrology and control systems.

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Received: 2016-2-4
Accepted: 2016-4-7
Published Online: 2016-5-9
Published in Print: 2016-6-1

©2016 THOSS Media & De Gruyter

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