Article
Open Access
Structural study of TiO2 thin films by micro-Raman spectroscopy
-
Ahti Niilisk
,
Mart Moppel
Published/Copyright:
March 1, 2006
Published Online: 2006-3-1
Published in Print: 2006-3-1
© 2006 Versita Warsaw
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- Divergence of geometrical optics series at the boundary of its applicability: An analytical example in elementary functions (2D Gaussian beam in free space)
- Coulomb blockade in molecular quantum dots
- Influence of iodine on the electrical properties of magnesium phthalocyanines thin film devices
- Spin-dependent transport through magnetic nanojunctions
- Large scale multi-configuration Hartree-Fock calculation of the hyperfine structure of the ground state of vanadium
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- Influence of interdiffusion on the electrical conductivity of multilayered metal films
- Ac electrical parameters of Al-ZnPc-Al organic semiconducting films
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Keywords for this article
Titanium dioxide;
thin films;
atomic layer deposition;
pulsed laser deposition;
Raman spectroscopy;
68.55.J;
78.30.Hv;
81.15.-z
Creative Commons
BY-NC-ND 3.0
Articles in the same Issue
- Divergence of geometrical optics series at the boundary of its applicability: An analytical example in elementary functions (2D Gaussian beam in free space)
- Coulomb blockade in molecular quantum dots
- Influence of iodine on the electrical properties of magnesium phthalocyanines thin film devices
- Spin-dependent transport through magnetic nanojunctions
- Large scale multi-configuration Hartree-Fock calculation of the hyperfine structure of the ground state of vanadium
- Stock mechanics: Predicting recession in S&P500, DJIA and NASDAQ
- Influence of interdiffusion on the electrical conductivity of multilayered metal films
- Ac electrical parameters of Al-ZnPc-Al organic semiconducting films
- Structural study of TiO2 thin films by micro-Raman spectroscopy
- Performance of lead iodide nuclear radiation detectors with the introduction of rare earth elements
- IBM-2 calculations of some even-even selenium nuclei
